Abstract
Methods to determine lifetimes of intermediate excited electronic states from up-conversion-luminescence transients induced by square-wave excitation pulses are presented. The methods are based on an excited-state absorption mechanism promoting population from a long-lived electronic state in the infrared to a short-lived emitting state in the visible. The methods are introduced for a three-level model system and applied to measure intermediate excited state lifetimes in three experimental examples of rare-earth or transition-metal ion doped insulating materials, namely CsCdBr 3:Ho 3+, Cs 2ZrBr 6:Os 4+, and Cs 2ZrCl 6:Os 4+.
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