Abstract

This paper aims to provide a multiple dependent state (MDS) sampling technique for light-emitting diode luminous intensities under indeterminacy by employing time truncated sampling schemes and the Weibull distribution. This indicates that ASN is significantly impacted by the indeterminacy parameter. Furthermore, a comparison is shown between the existing, indeterminate sampling plans and the recommended sample designs. The projected sampling technique is illustrated by calculating the luminous intensities of LEDs using the Weibull distribution. Based on the findings and practical example, we conclude that the suggested strategy needs a smaller sample size than SSP and the current MDS sampling plan.

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