Abstract
For long life light sources, such as Light Emitting Diodes (LED), evaluation and performance testing at nominal values is not a practical approach. Since it can take years to determine the life it is necessary to use methods of accelerated life testing. The effect of temperature on degradation of radiant flux GaN based High Power (HP) LED is monitored on two groups of commercial samples. The degradation is accelerated by increased values of pin temperatures. For the first test group, the degradation of radiant flux has exponential nature for all test temperatures, but for the second test group no degradation of flux is observed within the measured interval. This occurrence implies that is likely that different brands of HP LEDS have diverse heat extraction mechanisms from the LED junction.
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