Abstract
Li planar-doped ZnSe epilayers were grown by molecular beam epitaxy. The saturation of the acceptor doping level was revealed ( Na-Nd∼1×1017 cm-3). Exciton emissions bound to Zn vacancy were observed in the planar-doped epilayers, which suggests the escape of Li atoms from the planar-doped layers. Emission intensities of the exciton bound to Li acceptor were increased by the planar doping compared with those in homogeneously doped samples.
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