Abstract

The polycrystalline Mn 1% doped BFO (BFMO) thin film was deposited on Pt(111)/Ti/SiO2/Si(100) substrate by pulsed laser deposition. A thin SrTiO3 capping layer was grown on top of deposited Bi(Fe0.99Mn0.01)O3 thin film. The structural and electrical properties of STO/BFMO thin film were investigated. By capping a thin STO on top of BFMO, leakage current density of capacitor was improved greatly compare to that of the pure BFMO without degrading ferroelectricity.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.