Abstract
Highly (111)-oriented (Pb0.76Ca0.24)TiO3 (PCT) thin films were grown on Pt/Ti/SiO2/Si substrates by a sol–gel process. The Au/PCT/Pt metal–insulator–metal film capacitor showed well-saturated hysteresis loops at an applied field of 800 kV/cm with remanent polarization (Pr) and coercive electric field (Ec) values of 18.2 μC/cm2 and 210 kV/cm, respectively. The leakage current depended on the voltage polarity. At low electrical field and with Pt electrode biased negatively, the Pt/PCT interface exhibits a Schottky emission characteristics. The Au/PCT interface forms an ohmic contact. The conduction current when the Au electrode is biased negatively shows a space-charge-limited behavior. The dielectric relaxation current behavior of Au/PCT/Pt capacitor obeys the well-known Curie–von Schweidler law at low electric field. At higher fields, the currents have contributions to both dielectric relaxation current and leakage current.
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