Abstract
X-ray photoelectron spectroscopy (XPS) revealed a lead-rich carbonatelike surface layer on polycrystalline lead zirconate titanate films grown by metal-organic chemical vapor deposition. In situ XPS studies indicated that lead originally present in the oxide film reacted with Pt during its deposition, forming a Ti∕Zr-rich defective interfacial layer. Lead zirconate titanate films that underwent a nitric acid treatment, which effectively removed the surface layer, exhibited a stretched out of the hysteresis loop in the vicinity of the coercive field, consistent with the presence of a nonferroelectric passive layer. Reasonable agreement between the XPS-measured interface layer thickness and the thickness determined by electrical characterization was obtained.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
