Abstract
Lead oxide based thin films have more optical transparency because of high absorption and high reflection in the visible region. Lead oxide and vanadium doped lead oxide thin films were fabricated on a glass substrate at the optimized conditions by using Successive Ionic Layer Adsorption and Reaction (SILAR) technique. X-ray diffraction patterns revealed that both thin films exhibit orthorhombic crystal system. Average crystalline size is calculated using Debye Scherer’s formula. From William-Hall plots strain was calculated. Dislocation density can be determined by knowing average crystallite size. Different functional groups were determined by using FTIR spectroscopy. The optical absorption properties studied using ultraviolet-vis spectroscopy. 390 nm & 458 nm are the cut-off wavelengths of the thin films. The optical energy band spacing was calculated using the plot. The optical energy band gaps are 3.60 eV & 3.75 eV respectively for Lead oxide and Vanadium doped Lead oxide thin films. Photoluminescence (PL) spectrum reveals that the Lead oxide and Vanadium doped Lead oxide thin films emit yellow and green colour. Lead oxide and vanadium doped lead oxide thin films are good applicant for anti – reflection coating, solar thermal applications and infrared (IR) sensors.
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