Abstract
Lead-free BNT-ST and La0.5Ni0.5O3 (LNO) bottom electrode films were epitaxially grown onto CeO2/YSZ (yttria stabilized zirconia) buffered Si (001) substrates via pulsed laser deposition. The lattice alignment of CeO2/YSZ and BNT-ST/LNO showed 45° twisted cube-on-cube epitaxial relationship, indicating high crystallinity for the BNT-ST and LNO films. The constituent elements in the BNT-ST/LNO/CeO2/YSZ structure showed no distinct diffusion between the layers. The BNT-ST epitaxial films demonstrated ferroelectric properties, but exhibited a high degree of leakage current density.
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