Abstract
AbstractA novel method for the structurally identification of a nanocrystal from a single high resolution (HR) transmission electron microscopy (TEM) micrograph is described. Components of this method are demonstrated on both experimental and simulated HRTEM images. On the experimental side, the structural information that can be extracted from a HRTEM image is the projected reciprocal lattice geometry, the plane symmetry group, a few structure factor amplitudes and phases, and an outline of the projected atomic structure to the limited resolution of the HRTEM (via a Fourier synthesis of the structure factors). Searching for this information in a comprehensive database and matching it with high figures of merit to that of candidate structures should allow for highly discriminatory identifications of nanocrystals, even without additional chemical information as obtainable in analytical TEMs.
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