Abstract
Aiming at high magnetocrystalline anisotropies, small additions of carbon have been proposed to stabilize a tetragonal lattice distortion in Fe-Co. In the present work, the relaxation mechanisms of Fe-Co films containing 2 at. % C are examined in detail. Film growth on buffers with different lattice constants is compared by a combination of in situ reflection high energy electron diffraction and ex-situ X-ray diffraction measurements. It is shown that relaxation starts at a thickness around 2 nm and ends at a distortion of about 4%, which is independent from the chosen buffer. Integral XRD and magnetization measurements suggest that the relaxation occurs over the complete film thickness.
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