Abstract
ABSTRACTThe combination of the molecular beam epitaxy growth method with thein-situreflection high energy electron diffraction measurements currently offers unprecedented control of crystalline growth materials. We present here a stoichiometric study of MnxSc(1-x)[x= 0, 0.03, 0.05, 0.15, 0.25, 0.35, and 0.50] thin films grown on MgO(001) substrates with this growth method. Reflection high energy electron diffraction and atomic force microscopy measurements reveal alloy behavior for all of our samples. In addition, we found that samples Mn0.10Sc0.90and Mn0.50Sc0.50display surface self-assembled nanowires with a length/width ratio of ~ 800 – 2000.
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