Abstract
AbstractA method for determination of absolute lattice parameters of superlattices is described‐which does not use any relations to substrate reflections. For superlattices having tetragonal or trigonal symmetry, three parameters are to be determined. For this purpose, the diffraction angles of two reflections are measured, the third angle is obtained from the incidence angle difference of two single reflections of a “reflection group”. The peak shift caused by partial superposition of the single reflections, which occurs at larger superlattice periods, is corrected by means of simulation calculations. As an example, the results obtained on a PbTe/(Pb, Sn)Te superlattice are given and discussed.
Published Version
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