Abstract
Epitaxial La0.7Ca0.3MnO3 (LCMO) films of 15–150nm thick have been grown on SrTiO3(001) [STO(001)] and (LaAlO3)0.3(Sr2AlTaO6)0.7(001) [LSAT(001)] substrates with lattice mismatches of 1.11% and 0.15%, respectively. Asymmetric x-ray reciprocal space mapping was used to determine the strain state evolution in the films. For LCMO/STO(001), as the film thickness increases, at about 30nm a change from fully to partially strained has been induced, and a further annealing at 900°C can fully relax the films. For LCMO/LSAT(001), however, due to the negligible lattice mismatch, even at 15nm the films are almost fully relaxed. Correspondingly, for the fully relaxed LCMO films a paramagnetic to ferromagnetic transition at TC of about 260K was observed, and for those partially relaxed, both the structure and magnetic transition are inhomogeneous, two thickness-dependent TC were detected for each film. The results show strong evidence that the transition temperature is correlated with the strain state in epitaxial LCMO films.
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