Abstract
We presented a magnetic force microscopy and vibrating sample magnetometer study of perpendicular anisotropy of [Co t /Fe 3 t ] 5 ( t = 2, 3, 4, 5 nm) multilayers prepared by direct current magnetron sputtering on glass and Si substrates. It was found that except for the specimens with t = 2 nm, most specimens exhibited obvious weak perpendicular anisotropy. By analyzing the anisotropy field and the root-mean-square roughness of phase shift of magnetic force images, we compared the perpendicular anisotropy among the multilayers deposited on Si and glass substrates. As a result, it is concluded that the primary origin of the weak perpendicular anisotropy can be attributed to the compressive stress induced by the lattice mismatch between Fe and Co layers.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
