Latex characterization by atomic force microscopy

Abstract

AbstractWays, benefits and limitations of extracting the form and size of single latex particles or particle size distributions out of the surface topography of non‐coalesced latex films obtained by atomic force microscopy (AFM) are discussed. The general ways to generate the desired information out of topographical information in terms of height, surface curvature and lateral extensions are shown for idealized particles and measurement conditions. The different sources of information are evaluated for practical use and the analysis of particle size distributions is demonstrated by practical examples. The information content in lateral particle dimensions is shown to be the most advantageous for practical use.Determination of latex particle size distributions by AFM is shown to be an interesting alternative to the arsenal of available methods with respect to exactness of results, time consummation and instrumentation costs.