Abstract
We describe a technique for measuring the thermal diffusivity of substrate-supported polymer films based on the early-time electrothermal response following a 100 ns pulse from a Q-switched ruby laser. Data for a polyimide film spin coated on a p-doped Si[111] substrate are used to demonstrate the technique. From the late-time decay of the signal, we also obtain an estimate of the interfacial thermal-transport coefficient of the polymer–semiconductor interface.
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