Abstract
The photodetachment cross section of C 6F − 6 in liquid tetramethylsilane was measured as a function of the photon energy, using a new two laser photoconductivity technique. The photodetachment threshold was found to be 1.51 eV using a 3 2 power threshold law. Two maxima were observed in the photodetachment cross section at photon energies of 2.58 and 3.15 eV; the cross section value at these two maxima is ≈ 11 × 10 −18 cm 2.
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