Abstract
We have developed a method of evaluating the photo-induced carrier dynamics of nanostructures by combining optical technologies with multiprobe microscopy techniques. Using multiple probes, measurement can be carried out even for a small sample without complicated pretreatments, such as attaching electrode structures. Using transition metal dichalcogenides as a sample and a continuous laser or an ultrashort pulse laser as the light source, we demonstrated analyses of the carrier dynamics related to trap levels in a millisecond to second time domain and the ultrafast photoexcited carrier dynamics in the picosecond region.
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