Abstract
-based materials of different porosity and surface states have been studied by time-of-flight mass spectrometry (TOF-MS) under 308 nm excimer laser ablation. Sequences of SiO2-based negative ion clusters [(SiO2)nX]- are observed and variations of their abundance distributions with sample properties are studied. The unique roles of surface states in cluster formation are discussed.
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More From: Applied Physics A: Materials Science & Processing
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