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Abstract
Classical large-signal device models are indirectly derived from small-signal S-parameter measurements. Due to the availability of the nonlinear network measurement system (NNMS), models can be based directly upon full two-port large-signal measurements, resulting in higher model accuracy. In this article, we discuss three large-signal measurement-based modelling approaches. ©2000 John Wiley & Sons, Inc. Int J RF and Microwave CAE 10: 6–18, 2000.
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