Abstract
Applications running on future high performance computing (HPC) systems are more likely to experience transient faults due to technology scaling trends with respect to higher circuit density, smaller transistor size and near-threshold voltage (NTV) operations. A transient fault could corrupt application state without warning, possibly leading to incorrect application output. Such errors are called silent data corruptions (SDCs).In this paper, we present LADR, a low-cost application-level SDC detector for scientific applications. LADR protects scientific applications from SDCs by watching for data anomalies in their state variables (those of scientific interest). It employs compile-time data-flow analysis to minimize the number of monitored variables, thereby reducing runtime and memory overheads while maintaining a high level of fault coverage with low false positive rates. We evaluated LADR with 4 scientific workloads and results show that LADR achieved
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