Abstract
Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance values in the picometer range, with enormous impact on potential scientific applications. Here we present a new characterization method for such beams and demonstrate experimentally its ability to reconstruct the 4D transverse beam matrix of strongly correlated electron beams with sub-nanometer emittance and sub-micrometer spot size, produced with the HiRES beamline at LBNL. Our work extends the reach of ultrafast electron accelerator diagnostics into picometer-range emittance values, opening the way to complex nanometer-scale electron beam manipulation techniques.
Highlights
The advent of ultrafast lasers and rapid development of particle accelerator technology paved the way to the generation of dense, ultrashort electron pulses
Moving one step further and coupling high fields with MHz repetition rates results in a leap in average electron flux [4,5], which can in turn be used to produce transverse emittance values in the nanometer and picometer range [6,7,8], with a potentially enormous impact on scientific applications, including free-electron lasers (FEL) [9,10], ultrafast electron diffraction (UED) [11,12] and microscopy (UEM)[13,14,15], injection into laser-driven microstructure accelerators
We introduce a new methodology for characterization of the four-dimensional transverse beam matrix of electron beams extending the reach of the measurement space into picometer-scale emittance values and nanometer-scale spot sizes
Summary
The advent of ultrafast lasers and rapid development of particle accelerator technology paved the way to the generation of dense, ultrashort electron pulses. We introduce a new methodology for characterization of the four-dimensional transverse beam matrix of electron beams extending the reach of the measurement space into picometer-scale emittance values and nanometer-scale spot sizes. The technique merges the methodology typical of quadrupole scan described above with the high spatial precision in beam size measurements given by the knife-edge scan technique (widely used in laser optics [24]) assisted by a powerful data analysis and global fitting routine. Our results show the flexibility and the potential for such technique as high accuracy tool for measuring the evolution of transverse 4D phase space beam matrix submicrometer beam size and picometer range emittance, extending the reach of ultrafast instrumentation techniques by more than one order of magnitude in the transverse space. V we summarize the work and discuss possible future applications of the technique in the R&D of ultrahigh brightness electron sources
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