K-K-electron transfer and K-shell-vacancy production cross sections for Ti bombarded by 28Si and 32S beams at 1.25-4.70 MeV/amu.

Abstract

Single and double [ital K]-[ital K]-electron transfer and the [ital K]-shell-vacancy production cross sections for Ti bombarded by [sup 28]Si and [sup 32]S beams at energies varying between 1.25 and 4.7 MeV/amu have been determined, in the limit of zero target thickness, from the thickness variation of the Ti [ital K] x-ray yield with ion beams having 0, 1, or 2 vacancies in their [ital K] shell. From the measured energy shift and the intensity ratios of [ital K][alpha], [ital K][beta] lines, the average number of 2[ital p] and 3[ital p] vacancies were determined from which the average value of the fluorescence yield [omega][sub [ital K]] was deduced using the statistical scaling procedure of Larkins [J. Phys. B 4, L29 (1971)]. The single-electron transfer cross sections are compared with the calculations of Brinkman and Kramer as formulated by Nikolaev [Sov. Phys. JETP 24, 847 (1967)] and those of Lapicki and McDaniel [Phys. Rev. A 22, 1896 (1980)] and the modified two-center atomic-orbital-expansion model (AO+) of Fritsch and Lin [J. Phys. B 15, 1255 (1982)]. The double-electron transfer cross sections are also compared with the AO+ predictions. The [ital K]-shell-vacancy production data are compared with calculations based on the perturbed-stationary-state approachmore » with the Coulomb-deflection, binding-energy, and relativistic corrections (ECPSSR) included. In addition, the projectile cross sections for single-electron capture and loss have also been deduced at a few energies.« less