Abstract

The thermal oxidation kinetics of (100) and (111) oriented silicon in several oxygen/nitrogen mixtures ranging in oxygen partial pressure from 0.02 to 1.0 at 1200°C have been investigated. The parabolic rate constant and the linear rate constant varied linearly with respect to the oxygen partial pressure, while τ, a factor which accounts for an initial accelerated oxidation rate during dry oxidation of silicon, varied inversely with the oxygen partial pressure.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.