Abstract

We report the fabrication for the first time of a strontium fluoride (SrF(2)) whispering-gallery mode resonator with quality factor in excess of 1 billion. The millimeter-size disk-resonator is polished until the surface roughness decreases down to a root-mean square value of 1.2 nm, as measured with a vertical scanning profilometer. We also demonstrate that this ultrahigh Q resonator allows for the generation of a normal-dispersion Kerr optical frequency comb at 1550 nm.

Highlights

  • To cite this version: Remi Henriet, Guoping Lin, Aurélien Coillet, Maxime Jacquot, Luca Furfaro, et al

  • We report the fabrication for the first time of a strontium fluoride (SrF2) whispering-gallery mode resonator with quality factor in excess of 1 billion

  • The millimeter-size disk-resonator is polished until the surface roughness decreases down to a root-mean square value of 1.2 nm, as measured with a vertical scanning profilometer. We demonstrate that this ultrahigh Q resonator allows for the generation of a normal-dispersion Kerr optical frequency comb at 1550 nm

Read more

Summary

Introduction

To cite this version: Remi Henriet, Guoping Lin, Aurélien Coillet, Maxime Jacquot, Luca Furfaro, et al. We report the fabrication for the first time of a strontium fluoride (SrF2) whispering-gallery mode resonator with quality factor in excess of 1 billion. The millimeter-size disk-resonator is polished until the surface roughness decreases down to a root-mean square value of 1.2 nm, as measured with a vertical scanning profilometer.

Results
Conclusion
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call