K-Means Clustering and Bidirectional Long- and Short-Term Neural Networks for Predicting Performance Degradation Trends of Built-In Relays in Meters.

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The built-in relay in a meter is a key control component of a smart meter, and its reliability determines whether the user can use electricity safely and smoothly. In this paper, the degradation characteristics of the arc-burning energy are enhanced by the method of K-means clustering to replace degradation data, such as the overtravel time, release time, and other data. In existing methods, the meter needs to be disassembled to describe the degradation trend of the meter relay. The proposed method is combined with a bidirectional long short-term memory (Bi-LSTM) neural network to predict the degradation trend of the relay's performance. In this paper, K-means clustering is used to enhance the extraction of arc energy data features, and then the arc energy data obtained from the reliability lifetime test is assessed to predict the degradation trend of the meter relay by means of a bidirectional LSTM.