Abstract
It is known that moving grain boundaries (GBs) interact with the thermal grooves developing along the line where the GB intersects the surface. The questions of the GB migration character (continuous or jerky) is of principal importance for the theory of GB migration and grain growth. Recent computer simulation studies of GB migration in pure materials have shown that the calculated GB mobilities are many orders of magnitude higher than those usually observed in the experiment even in very pure materials. If the jerky GB motion is a common phenomenon then the GB mobility measured in the macroscopic experiments can differ considerably from the true microscopic mobility, since in the former case the time which the GB spent in the locked position is taken into account. In this paper, the authors will demonstrate the potential of atomic force microscopy (AFM) in deducing the real dynamic behavior of the GBs at high temperature from the post-mortem studies of the surface topography in the region of ghost lines.
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