Abstract
The grain boundary (GB) mobility relates GB velocity to the thermodynamic driving forces and is central to our understanding of microstructure evolution in polycrystals. Recent molecular dynamics (MD) and experimental studies have shown that the temperature-dependence of the GB mobility is much more varied than is commonly thought. GB mobility may increase, decrease, remain constant or show multiple peaks with increasing temperature. We propose a mechanistic model for GB migration, based on the formation and migration of line defects (disconnection) within the GB. We implement this model in a kinetic Monte Carlo and statistical mechanics framework; the results capture all of these observed temperature dependencies and are shown to be in quantitative agreement with each other and direct MD simulations of GB migration for a set of specific grain boundaries. Examination of the dependence of GB mobility on disconnection mode and temperature provides new insight into how GBs migrate in polycrystalline materials.
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