Abstract

The effect of low-energy electron-beam irradiation on the stability of acceptor–hydrogen complexes in Mg-doped GaN has been directly examined with infrared optical spectroscopy. Consistent with prior electrical transport data, we find that Mg–H pairs begin to break apart under 25 keV electron-beam exposure at doses of a few mC/cm2. However, we find that, even after long exposures, roughly 12 of the acceptor–hydrogen pairs remain unaffected by the electron exposure. Using Mg-doped samples that have been vacuum annealed and D2 gas exposed, we demonstrate that there is a large (∼×5) isotopic shift in the beam-induced debonding rate of these acceptor–hydrogen complexes. H and D remain in the material during these treatments, and Mg–H or Mg–D reforms during postirradiation annealing. The implications of these observations for understanding the nature of the debonding process and the subsequent reactions of the detached H/D in the GaN lattice are discussed.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.