Abstract
A continuum-based design sensitivity analysis (DSA) method is developed for nanoscale structures with surface effects. To account for the effects of precise geometry in the response and the design sensitivity analyses, we employ an isogeometric approach which uses the same NURBS basis functions as used to describe the geometry of CAD. A direct differentiation method is employed to obtain the analytical design sensitivity using a generalized Young-Laplace equation with high-order surface effects. Effective material properties with the surface effects for silver nanowires are measured from a three-point bending test using atomic force microscopy (AFM). The diameter and the suspended length of silver nanowires are considered as sizing and shape design variables, respectively. The design sensitivity expressions are derived with respect to the design parameters and validated comparing with the experimental results from the AFM scanning, showing an acceptable agreement.
Published Version
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