Abstract
This paper reports an unusual extent of mixing in Bi/Te thin bilayer system using 90 MeV Au and 95 MeV Ag ions of energies having same electronic energy loss (Se) value. The analysis is made using Rutherford backscattering spectroscopy and atomic force microscopy. The mixing variance as observed from the depth profiles extracted from RBS data using Rutherford universal manipulation program is found to be higher for Au irradiated samples. Similarly higher sputtering yield is observed for Au ions than Ag ions. These have been accounted to ion velocity effect of Bi/Te with Au ions having velocity ~1.3 times slower to Ag ions.
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