Abstract
Kinetic energy distributions of singly charged, positive 16O + ions that were sputtered and/or elastically scattered from planar polished surfaces of sphalerite, bornite, chalcopyrite, pentlandite, pyrrhotite, arsenopyrite, pyrite and galena under O 2 + bombardment were acquired using a dynamic SIMS instrument. Ion contributions attributed to binary elastic-backscattering (O → element) collisions were identified. Data resolution was such that 32S and 34S contributions were discernable. For higher mass elements, resolution dropped such that isotopic contributions were no longer distinguishable. S peak areas were found not to be related to bulk element concentration, while for Fe a weak relationship between peak area and bulk element concentration was observed.
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