Abstract
Abstract3D perovskite materials are advancing rapidly in the field of photovoltaics and light‐emitting diodes, but the development in field effect transistors (FETs) is limited due to their intrinsic ion migration. Ion migration in perovskite FETs can screen the electric field of the gate and affect its modulation, as well as influence the charge carriers transport, leading to non‐ideal device characteristics and lower device stability. Here, we provide a concise review that explains the mechanism of ion migration, summarizes the strategies for suppressing ion migration, and concludes with a discussion of the future prospects for 3D perovskite FETs.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
