Abstract
Rough ground samples of fused silica were irradiated with an argon ion beam. At high angles of incidence the randomly pitted surface structure was converted to a striated surface. An explanation for the development of the striated topography is based on the dependence of sputtering rate on the localized angle of incidence of the ions with respect to individual surface features. Experimental conditions for removal of isolated surface defects and the conditions under which a smooth surface may be produced by ion erosion are discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
