Abstract
An increasing number of alternative two-dimensional (2D) materials are being explored in the “post-graphene age”, such as transition metal dichalcogenides (TMDs), silicene, and germanene. In this study, multiple measurements, including scanning tunneling microscopy (STM), electrical transport and Raman spectroscopy are performed on freshly cleaved surfaces of semimetallic tungsten ditelluride (WTe2) crystals. High sample quality with very low density of defects is confirmed by STM observation and four Fermi pockets can be revealed by Shubnikov–de Haas (SdH) oscillations based on transport measurement. Furthermore, we investigate Raman spectroscopy of thin-layer WTe2. Our results reveal that few-layer WTe2 could be an ideal candidate for future 2D electronic, optoelectronic devices.
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