Abstract
We investigated atomically resolved NC-AFM images of NiO(001) surfaces obtained withferromagnetic Fe- and Ni-coated tips and bare Si tips. The cross-sections of atomicallyresolved images were analysed by adding the atomic corrugation amplitude on the basis ofthe periodicity of the image. The topographical asymmetry is defined as an indexrepresenting the difference of the adjacent maxima. We compare the topographicalasymmetry calculated from the images obtained with ferromagnetic metal- and non-coatedSi tips and discuss the possible origin of the asymmetry of NC-AFM images.
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