Investigations on structural and opto-electrical characterization of Ag-TCNQ (metal-organic frameworks) as complex thin films for potential device applications

Abstract

The silver- (7, 7, 8, 8-tetracyanoquinodimethane (Ag-TCNQ) organometallic complex was synthesized chemically as a nano-powder and thereafter deposited as a thin film by thermal evaporation. The monoclinic, needle-like, polycrystalline structure of the Ag-TCNQ complex was analyzed employing x-ray diffraction (XRD) and a scanning electron microscope (SEM). Whereas their chemical structure and stability were explored using Fourier transformation infrared (FTIR) techniques. The findings imply a charge transfer of degree −0.5 between TCNQ° and TCNQ−, as revealed by the shift of the bands of the C≡N stretching and the (C═C-H) bond positioned at 2198 and 824 cm−1, respectively. As well as the optical properties of Ag-TCNQ thin film were studied using spectrophotometric measuring in the wavelength ranging 200 to 2500 nm. The measurement of transmittance and reflectance spectra were employed to calculate the refractive index (n), dielectric constant, absorption index (k), surface and volume energy loss functions, and optical conductivity. In the normal dispersion zone, optical characteristics such free charge carrier concentration, infinity dielectric constant (ε ∞), lattice dielectric constant (ε L), oscillator energy (Eo), and dispersion energy (Ed) were estimated. Furthermore, the optoelectronic nonlinear optical features and electronic transitions for the Ag-TCNQ thin film were assessed. Finally, these findings are promising milestones on the path to providing convincing evidence for the synthesis of stoichiometric thermally stable Ag-TCNQ thin film by conventional thermal evaporation technique that is potential to be utilized in optoelectronic devices applications.