Abstract

ABSTRACT Cu2ZnSnS4 (CZTS) is considered as a suitable absorber material for thin-film solar cell applications due to its optimum electrical and optical properties. In the present study, CZTS thin films are successfully deposited onto the glass substrates using SILAR method. Structural, morphological, optical and electrical properties of the deposited CZTS thin films are analyzed. X-ray diffraction (XRD) analysis confirms the formation of tetragonal structure of the deposited thin films. Microstructure analysis and elemental mapping are carried out using HRTEM. Functional groups present in the film are analyzed by FTIR studies. The Raman peaks present at 287, 336 cm−1 are attributed to A1 vibration mode of CZTS thin films. Band gaps values of CZTS films, calculated using Tauc’s plot, lie between 1.55 and 1.98 eV and are found to be suitable absorbing materials for solar cell applications.

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