Investigation on growth and characterization of dimethyl ammonium picrate (DMAP) single crystal grown by conventional and SR method

Abstract

Nonlinear optical bulk single crystal of dimethyl ammonium picrate (DMAP) has been grown by slow evaporation solution technique (SEST) and subsequently by Sankaranarayanan–Ramasamy (SR) method using acetone as solvent. The transparent DMAP single crystal of maximum diameter 20 mm and length 50 mm was obtained by employing SR method. The grown crystals were subjected to high resolution X-ray diffraction, UV transmittance, refractive index, hardness, dielectric and laser damage threshold studies. The crystal perfection of the grown crystal was analyzed using HRXRD. Lower cut off wavelength and optical transmission window of the crystal was assessed by UV–vis–NIR and the refractive index of the crystal (0 0 1) plane was found. The mechanical property of the crystal (0 0 1) plane was estimated by Vickers hardness test. The dielectric property of the crystal was measured as a function of frequency (100 Hz–1 MHz). The laser damage threshold value was determined on (0 0 1) plane. The present study indicates that the crystal quality of SR method grown DMAP is better than crystal grown by conventional slow evaporation method.