Abstract
An interlayer Li inserting between copper phthalocyanine (CuPc) and Al improves both electric and luminous properties of an organic light-emitting diode (OLED). X-ray photoelectron spectroscopy (XPS) surface analysis technique is employed to investigate chemical binding conditions of CuPc/Li interface. At varying thicknesses of Li deposited on CuPc, we have studied and XPS of CuPc films. Investigation demonstrates that Cu atoms are liberated from CuPc with increasing Li thicknesses. The results reveal that an OLED with an indium tin oxide glass/triphenyldiamine derivative/tris(8-hydroxyquinoline)aluminum/CuPc/Li/Al structure employing a 2 nm thick Li exhibits optimum performance. It can satisfy commercial demands in not only good reproducibility but also a large area of uniformality. © 2003 The Electrochemical Society. All rights reserved.
Published Version
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