Abstract
The results of combined investigations by Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS) of thin films of yttrium and yttrium hydride are presented. The hydride phase was prepared by exposing evaporated metal films to hydrogen in a high pressure reaction chamber connected to the main UHV vessel. Special attention was paid to the effects of surface contamination by oxygen. The specific spectroscopic characteristics of the metal and the hydride phase are compared and analysed in terms of the known electronic structures of yttrium and yttrium hydrides.
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