Investigation of x-ray-energy responses of semiconductor detectors under deuterium–tritium fusion-produced neutron irradiation

Abstract

For the purpose of investigating fusion-produced neutron effects on semiconductor x-ray detectors, detection characteristics of x-ray tomography detectors used before and after deuterium–tritium (DT) and/or DD fusion-plasma experiments in the Joint European Torus (JET) tokamak are studied using synchrotron radiation from a 2.5 GeV positron storage ring at the Photon Factory. Degradations in the responses after neutron exposure into the detectors are found to have functional dependence on x-ray energy. Changes in the depletion thicknesses of the detectors are investigated by means of impedance analyses. The Fusion Neutronics Source (FNS) facility of the Japan Atomic Energy Research Institute is also employed for well calibrated DT fusion-produced neutron irradiation onto these semiconductor x-ray detectors. Recovery of the response degradation is found due to a method for supplying the operational bias to the degraded detector. Our theory is applied to interpret these detector characteristics under the irradiation of DT fusion-produced neutrons in the JET tokamak and the FNS facility.