Abstract
The dissipative and conservative interactions between a sharp probe and a flat Si sample in the ultrasonic/shear-force microscope are investigated. It is shown that, when working in the ambient condition, there are two distinct probe-sample interaction regions: the pure dissipative interaction region in the relatively far probe-sample distance, and the highly correlated dissipative and conservative interaction region in the close probe-sample distance. The ultrasonic data suggest that the phonon generation is a dissipative channel for the probe-sample interaction in the shear force microscope. A shaking potential model is proposed to explain the phononic friction mechanism.
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