Abstract
Solid-state diffusion bonding (DB) of Copper-Copper (Cu/Cu) was carried out under varying bonding parameters (time and temperature) in argon shielding gas environment. Initially, the bonding was performed at bonding temperatures of 800, 850, and 900 °C for 60 minutes. Secondly, the bonding was carried out at holding times of 90, 120, and 150 minutes at 900 °C. The microstructural and mechanical properties of the bonding interface were evaluated via lap shear and micro hardness tests, X-ray diffraction, and Optical microscopy. It was found that the optimal bonding parameters for the joint interface was 950 °C for 150 minutes, resulting in maximum shear strength of 133 MPa. The X-ray diffraction also shows the formation of solid solution of Cu without the formation of any intermetallic compounds (IMC). The micro hardness test revealed a maximum hardness of 89 HV at the joint interface. Optical microscopy shows the formation of voids at the joint interface take place due to the Kirkendall effect, which increased with higher temperatures for longer time, and cause a wide diffusion-affected zone (DAZ).
Published Version
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