Investigation of the Effect of Temperature on Fault Injection using Intentional Electromagnetic Interference

Abstract

In this paper, we investigate the temperature dependence of the efficiency of fault injection on cryptographic circuits using IEMI(Intentional electromagnetic interference). The attacks that use IEMI to generate clock glitches and faults in cryptographic circuits have been proposed. The fault timing, which determines the analyzability, depends on the width of the clock glitch. The width of the clock glitch induced by IEMI is determined by the shape of the clock signal. On the other hand, if the propagation delay of the internal combinational logic circuit is changed, the occurrence of faults may change even if the width of the clock glitch is the same. In this paper, we construct a measurement system that can simultaneously measure both the generated clock glitch and the propagation delay of the internal combinational logic circuit, and confirm the change in the efficiency of fault injection with temperature.