Analysis of Fault Characteristics Based on Clock Glitch Injection

Abstract

Fault injection attack can create instantaneous electrical pulses or thermal noise in the actual operating cryptographic circuit, thereby destroying the original time constraints on the cryptographic circuit, triggering the inversion of the intermediate state of the cryptographic algorithm and reducing the security strength of the cryptographic algorithm. Currently, clock glitch presents one of the most commonly used fault injection methods, which pose serious threat to the security of password applications. Focusing on the implementation of block cipher FPGA applications and based on the built-in clock glitch fault injection test platform, we study the fault characteristics caused by clock glitch in this paper. The relevant conclusions can be extended to other fault injection mechanisms with fault caused by time constraint violation of the cipher circuit.