Abstract
PEDOT:PSS/Au/PEDOT:PSS multilayer films were successfully prepared and investigated. The PEDOT:PSS and Au layers were prepared using spin coating and DC sputtering, respectively. The thickness of the Au layer was varied within the range of 2–10 nm to investigate its impact on the resulting multilayer films. The amorphous nature of the multilayer films was interpreted from X-ray diffraction analysis. Fourier-transform infrared spectroscopy identified that the multilayer films were the major surface chemical structure of PEDOT:PSS. The optical transmittance and sheet resistance characteristics of the multilayer films exhibited a significant reduction owing to the presence of the Au interlayer. In order to evaluate the optical-electrical properties of the multilayer films, a figure of merit (FOM) was calculated. Remarkably, the multilayer films featuring a thin Au layer of 2 nm yielded the highest FOM value. Therefore, it can be demonstrated that multilayer films of PEDOT:PSS/Au/PEDOT:PSS fabricated with a thin Au layer can be applicable for utilization in optoelectronic devices.
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