Abstract
The structural features of hexadecafluorinated copper and zinc phthalocyanine (MPcF16) films (M = Cu, Zn) obtained by vacuum thermal deposition are investigated. The dependence of structural features of these films on the film thickness is studied by means of optical and Raman spectroscopy. It is shown that an increase in the thickness of MPcF16 films, as well as film annealing under vacuum conditions at a temperature of 220°C, leads to the formation of the phase whose crystalline structure differs from that of the 20-to 50-nm-thick initial films.
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