Abstract

To meet the demand of electronic devices pure polycrystalline yttrium iron garnet with cubic structure is investigated by sol gel method. The crystalline information and identification of garnet phases is confirmed using X-ray Diffraction. The X-ray diffraction pattern is analyzed by utilizing Rietveld Refinement method using Fullprof Software suite. Well defined domain morphology is observed in the High Resolution Scanning Electron Microscope image (HR-SEM). Pure YIG is inspected by Impedance Spectroscopy (IS) using Cole-Cole plot and Bode plot. It is interpreted using electrical circuit which is the combination of resistors and capacitors. The effect of g value of the sample is measured using Electron Spin Resonance (ESR).

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